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Three-dimensional simulation of nanocrystal Flash memories

autori
G. Iannaccone, P. Coli
anno
2001
tipo prodotto
Articolo su rivista scientifica Index Medicus, Science Citation Index
rivista
APPLIED PHYSICS LETTERS
isbn-issn
0003-6951
tipo indicizzazione
ISI
lingua
Inglese
volume/numero rivista
78
numero pagine
3
pagina iniziale
2046
numero
14
data articolo
2001
ABSTRACT
We have developed a code for the detailed simulation of nanocrystal Flash memories, which consist of metal-oxide-semiconductor field-effect transistors (MOSFETs) with an array of semiconductor nanocrystals embedded in the gate dielectric. Information is encoded in the MOSFET threshold voltage, which depends on the amount of charge stored in the nanocrystal layer. Nanocrystals are charged through direct tunneling of electrons from the channel. Such memories are promising in terms of shorter write-erase times, larger cyclability, and lower power consumption with respect to conventional nonvolatile memories. We show results obtained from the self-consistent solution of the Poisson-Schrödinger equation on a three-dimensional grid, focusing on the charging process and on the effect of charge stored in the nanocrystals on the threshold voltage.
schede autori
IANNACCONE GIUSEPPE